Interferometer

White light interference - measuring thickness

White light is reflected differently from the upper and lower boundary surfaces of thin films. The reflected light waves are overlaid; they interfere. This interference is related to the coating thickness and can be measured with a spectrometer.

Different measuring ranges are covered by different types of light. The white light interference meter is especially suitable for transparent layers and film.


Optoscope WLI

Measurement of thickness / layer thickness

Matthias Wulbeck Mr Matthias Wulbeck
+49 9441 601 123
matthias.wulbeck@mahlo.com
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White light interference

White light from the upper and lower boundary surfaces of thin films is reflected differently. Interference measurement allows for the precise measuring of transparent coatings on films and mono-films. Both, the layer thickness and film thickness can be determined with a special measuring process.

Product Highlights

  • Simple and rapid measurement method
  • Measures coating thickness and film thickness
  • High accuracy and durability

Customer benefits

  • Quick process optimization
  • Material savings
  • Quality assurance

When white light is reflected from thin layers, this reflection appears colorful like a rainbow. This effect can be observed for example in a thin film of oil on a puddle of water. The light is reflected at both the upper and lower boundary of the part. The superimposed reflections interfere. The interference is related to the layer thickness and can be detected by a spectrometer.

SpecificationValueUnit
TypeWLI-R-UV-WISWLI-R-NIR 
Spectral range330 - 1200940 - 1700nm
Measuring range0,2 - 2501 - 130µm

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