White light is reflected differently from the upper and lower boundary surfaces of thin films. The reflected light waves are overlaid; they interfere. This interference is related to the coating thickness and can be measured with a spectrometer.
Different measuring ranges are covered by different types of light. The white light interference meter is especially suitable for transparent layers and film.
Optoscope WLI
Measurement of thickness / layer thickness
White light interference
White light from the upper and lower boundary surfaces of thin films is reflected differently. Interference measurement allows for the precise measuring of transparent coatings on films and mono-films. Both, the layer thickness and film thickness can be determined with a special measuring process.
Product Highlights
- Simple and rapid measurement method
- Measures coating thickness and film thickness
- High accuracy and durability
Customer benefits
- Quick process optimization
- Material savings
- Quality assurance
When white light is reflected from thin layers, this reflection appears colorful like a rainbow. This effect can be observed for example in a thin film of oil on a puddle of water. The light is reflected at both the upper and lower boundary of the part. The superimposed reflections interfere. The interference is related to the layer thickness and can be detected by a spectrometer.
Specification | Value | Unit | |
---|---|---|---|
Type | WLI-R-UV-WIS | WLI-R-NIR | |
Spectral range | 330 - 1200 | 940 - 1700 | nm |
Measuring range | 0,2 - 250 | 1 - 130 | µm |