White light is reflected differently from the upper and lower boundary surfaces of thin films. The reflected light waves are overlaid; they interfere. This interference is related to the coating thickness and can be measured with a spectrometer.
Different measuring ranges are covered by different types of light. The white light interference meter is especially suitable for transparent layers and film.
Optoscope WLI
Measurement of thickness / layer thickness
White light interference
White light from the upper and lower boundary surfaces of thin films is reflected differently. Interference measurement allows for the precise measuring of…
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