Thickness measurement
Non-contact measurement of thickness and layer thickness of continuous web processes
Products
Systems for on-line measurement and control of thickness / layer thicknes in continuous web processes
Qualiscan QMS -12 Bestseller
Traversing quality control system
Web process control
The Qualiscan QMS is a modular system for measuring, logging and controlling critical process parameters over the entire width of the product, including basis weight,…
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Diecontrol APC Pro
Automatic Extrusion Die Control System
Automatic control of thermal diebolts of extrusion dies
The DieControl APC Pro automatically controls thermal bolts of extrusion dies according to the earlier measured cross-section profile of…
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Calipro DML
Measurement of thickness (contactless)
Laser triangulation
The Calipro DML optical system uses laser triangulation online to measure the thickness or coating thickness of various materials with the highest accuracy.
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Calipro DMS
Measurement of thickness (contactless)
LED micrometer
Calipro DMS measures the material thickness of the product using a light curtain. It is insensitive to colour, transparency and opacity as well as largely independent…
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Gravimat FMI/DFI
Measurement of basis weight (mass per unit area) / thickness /density
Transmission of beta rays
The weight monitoring and control system measures the weight continuously, without contact, destruction-free and on moving product. The measurement is based…
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Gravimax MMX
Measurement of basis weight / component composition
X-ray absorption, X-ray backscatter: basis weight & component measurement
The Gravimax-MMX-R platform features X-ray sensors (absorption and backscatter) for measuring basis weight…
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Gravimat FMX-T
Measurement of basis weight (mass per unit area) / thickness / density
Transmission of X-rays
The Gravimat FMX-T permits the contactless and traversing measurement of basis weight (grammage) / thickness of the running product webs over the entire…
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Optoscope WLI
Measurement of thickness / layer thickness
White light interference
White light from the upper and lower boundary surfaces of thin films is reflected differently. Interference measurement allows for the precise measuring of…
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