Optoscope WLI-R-UV/VIS: A new interferometer for thickness / layer thickness
As the name suggests, the spectral range of the spectrometer covers the UV range and the visible light range. The large spectral range results in a wide measuring range of 0.2 - 250 µm thickness of the single layer. In the future, multi-channel measurement will also be possible. Then the thickness of several single layers can be measured simultaneously.
The main fields of application are film extrusion and film coating.
The Optoscope WLI-UV/VIS measures the interference of wavelengths reflected from different layers.
| Specification | Value | Unit |
|---|---|---|
| Measuring range | 0,2 - 250 | µm |
| Measuring distance | 5 - 30 | mm |
| Scanning spot | ~ 2 | mm |
| Measurement accuracy, laboratory | 0,01 | µm |
Do you have further questions?
Our expert will be happy to assist you. Just give us a call!
Matthias Wulbeck
+49 9441 601 102
matthias.wulbeck@mahlo.com
Product Manager QCS / Area Sales Manager Germany, Scandinavia, Netherlands, Eastern Europe, Russia, Central Asia, Caucasus
+49 9441 601 123+49 9441 601 102
matthias.wulbeck@mahlo.com
Mahlo GmbH + Co. KG
Donaustraße 12
93342 Saal an der Donau