Optoscope WLI

Measurement of thickness / layer thickness

White light interference sensor Optoscope WLI

Interference measurement of thin layers and coatings

Qualiscan QMS-12 Traversing quality control system

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Your contact

Mr Matthias Wulbeck

+49 9441 601 123
matthias.wulbeck@mahlo.com

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White light interference

White light from the upper and lower boundary surfaces of thin films is reflected differently. Interference measurement allows for the precise measuring of transparent coatings on films and mono-films. Both, the layer thickness and film thickness can be determined with a special measuring process.

Product Highlights

Simple and rapid measurement method
Measures coating thickness and film thickness
High accuracy and durability

Customer benefits

Quick process optimization
Material savings
Quality assurance

When white light is reflected from thin layers, this reflection appears colorful like a rainbow. This effect can be observed for example in a thin film of oil on a puddle of water. The light is reflected at both the upper and lower boundary of the part. The superimposed reflections interfere. The interference is related to the layer thickness and can be detected by a spectrometer.