Optoscope WLI
Measurement of thickness / layer thickness
White light interference sensor Optoscope WLI
Interference measurement of thin layers and coatings
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White light interference
White light from the upper and lower boundary surfaces of thin films is reflected differently. Interference measurement allows for the precise measuring of transparent coatings on films and mono-films. Both, the layer thickness and film thickness can be determined with a special measuring process.
Product Highlights
- Simple and rapid measurement method
- Measures coating thickness and film thickness
- High accuracy and durability
Customer benefits
- Quick process optimization
- Material savings
- Quality assurance
When white light is reflected from thin layers, this reflection appears colorful like a rainbow. This effect can be observed for example in a thin film of oil on a puddle of water. The light is reflected at both the upper and lower boundary of the part. The superimposed reflections interfere. The interference is related to the layer thickness and can be detected by a spectrometer.
| Specification | Value | Unit | |
|---|---|---|---|
| Type | WLI-R-UV-WIS | WLI-R-NIR | |
| Spectral range | 330 - 1200 | 940 - 1700 | nm |
| Measuring range | 0,2 - 250 | 1 - 130 | µm |
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